White Light Interference is a high-precision optical measurement technique widely used in fields such as surface profiling, thin film thickness measurement, and optical component inspection. ATOMetrics applies advanced white light interferometry to achieve non-contact and nanometer-level measurement accuracy across a wide range of materials and structures.
The principle is based on the interference of broadband white light reflected from different surfaces. When the optical path difference between the reference and test surfaces falls within the coherence length of the light source, interference fringes are formed. By analyzing these fringes, the system accurately determines surface height or film thickness. Because white light has a short coherence length, it allows precise measurement of absolute surface position and eliminates ambiguity often found in monochromatic interference.
White Light Interference technology has become an essential metrology tool in precision manufacturing and research:
ATOMetrics integrates White Light Interference technology into its high-precision optical metrology systems. Our instruments feature real-time data processing, automatic calibration, and robust environmental adaptability. Whether for R&D laboratories or production line integration, ATOMetrics systems deliver repeatable and traceable measurement results that meet international standards.
With years of expertise in optical measurement and industrial automation, ATOMetrics offers customizable white light interferometry solutions tailored to diverse applications. Our systems combine precision optics, high-speed sensors, and intelligent analysis software to ensure reliable and efficient measurements in even the most demanding environments.
Contact ATOMetrics today to learn more about our White Light Interference systems and how they can enhance your measurement capabilities.