Knowledge articles | Atometrics optical surface roughness analyzer, white light

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3D Laser Profiler Sensor | Atometrics High-Precision Surface Measurement

3D Laser Profiler Sensor | Atometrics High-Precision Surface Measurement

Atometrics provides advanced 3D laser profiler sensors for precise, non-contact surface measurement. Our systems deliver high-resolution 3D surface profiling, dimensional inspection, and topography analysis for industrial, research, and precision manufac

high resolution surface profilometer

high resolution surface profilometer

Atometrics provides high-resolution surface profilometers for precise, non-contact measurement of surface topography, roughness, and texture. Our systems deliver accurate 3D profiling and analysis for industrial, research, and precision manufacturing app

Confocal Displacement Sensor for Precision Measurement | Atometrics High-Precision Non-Contact Metrology

Confocal Displacement Sensor for Precision Measurement | Atometrics High-Precision Non-Contact Metrology

Atometrics provides advanced confocal displacement sensors for high-precision, non-contact measurement. Our systems enable accurate 3D surface profiling, thickness measurement, and dimensional analysis for industrial, research, and precision manufacturin

white light interferometer for surface measurement

white light interferometer for surface measurement

Atometrics provides advanced white light interferometers for precise, non-contact surface measurement. Our systems deliver high-resolution 3D surface profiling, roughness analysis, and topography evaluation for industrial components, precision manufactur

Confocal Displacement Sensor | Atometrics High-Precision Non-Contact Measurement

Confocal Displacement Sensor | Atometrics High-Precision Non-Contact Measurement

Atometrics provides advanced confocal displacement sensors for high-precision, non-contact measurement of surface topography and dimensional features. Our optical systems deliver accurate displacement, thickness, and 3D surface measurements for industria

Copper Clad Laminate Thickness Measurement | Atometrics Precision Metrology

Copper Clad Laminate Thickness Measurement | Atometrics Precision Metrology

Atometrics provides advanced copper clad laminate (CCL) thickness measurement solutions using high-precision, non-contact optical metrology. Our systems deliver accurate thickness evaluation for PCBs, laminated materials, and precision electronics applic

Digital Microscopy | Atometrics High-Resolution Optical Inspection

Digital Microscopy | Atometrics High-Resolution Optical Inspection

Atometrics provides advanced digital microscopy solutions for high-resolution, non-contact imaging and measurement. Our systems enable precise visualization, inspection, and analysis of components, materials, and microstructures in industrial and researc

Wafer Silicon Dioxide Film Thickness Testing | Atometrics Precision Metrology

Wafer Silicon Dioxide Film Thickness Testing | Atometrics Precision Metrology

Atometrics provides advanced wafer silicon dioxide (SiO2) film thickness testing solutions using high-precision, non-contact optical metrology. Our systems deliver accurate thickness evaluation for semiconductor wafers, MEMS devices, and precision thin-f

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