Case Study | Atometrics optical surface roughness analyzer, white light interfer

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Diamond wafers for advanced process nodes: It all starts with thickness control.

As ultra-thin wafers become increasingly common, their mechanical brittleness rises significantly once the thickness drops below 50 μm. For wafers made from third-generation semiconductor materials—such as SiC and GaN—which are characterized by high hard

Precision Inspection of Glass Substrates: Atometrics Solution Improves Yield to 90%

Atometrics white light interferometer (accuracy 0.03nm) & ultra-depth-of-field microscope - a high-precision inspection solution, helps improve the yield of glass substrates to 90% and accelerates the process of industrial upgrading.

Roughness and flatness: two unavoidable challenges for Faraday rotation glass

The Faraday rotatable plate is the core crystal element inside an optical isolator, acting as a "one-way valve" in the optical module. Its crystal quality and surface condition directly determine the isolator's insertion loss, isolation, and power handli

microchannel

Introducing white light interferometers to control the morphology of microfluidic chips significantly improves performance.

White light interferometers enable nanoscale control of microfluidic chip surface roughness, as well as microchannel height and width, improving the performance and quality of microfluidic products and meeting the needs of different customers.

The quality of heat dissipation in an optical module can be determined by a difference of 0.1 micrometers in the roughness of the liquid cooling plate.

With the rapid development of AI, heat dissipation of optical modules has become a crucial problem to solve, and liquid cooling has become the mainstream solution. At this time, the roughness of the liquid cooling plate can affect the heat dissipation sp

Gallium Oxide Substrate Surface Roughness and 3D Topography: Atometrics Testing Time Reduced to Mere Seconds

Gallium Oxide Substrate Surface Roughness and 3D Topography: Atometrics Testing Time Reduced to Mere Seconds

Gallium oxide, a fourth-gen semiconductor with a wide bandgap, sees progress by Garensemi in 6-inch substrates. Atometrics' AM7000 White Light Interferometer enables fast, precise 3D topography and roughness measurement, outperforming AFM.

Evolution and Precision Measurement of Semiconductor Wafer Thickness

Evolution and Precision Measurement of Semiconductor Wafer Thickness

Demand for semiconductor wafers grows, with thickness measurement evolving from contact to non-contact methods. Atometrics' spectral confocal sensors, with high precision, material agnosticism and large-angle capability, enable automated, accurate measur

Exploration the application of Atometrics in weld seam inspection

Industry | Exploration the application of Atometrics in weld seam inspection With the development of modern industry, welding technology plays an increasingly important role in manufacturing. However, weld quality has always been a key factor restricting

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