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Non-Contact Surface Measurement for Chip Decap: Leveraging White Light Interferometer Expertise from High-Precision Instrument Specialists

Non-Contact Surface Measurement for Chip Decap: Leveraging White Light Interferometer Expertise from High-Precision Instrument Specialists

Chip Decap is a key semiconductor analysis technique using chemical, mechanical, or laser methods to expose internal structures. The advanced laser method is a form of Non-Contact Surface Measurement, requiring the expertise of a Specialist in High-Prec

Ensuring Passivation Layer Integrity with a White Light Interferometer: The Role of White Light Interferometry in Chip Reliability

Ensuring Passivation Layer Integrity with a White Light Interferometer: The Role of White Light Interferometry in Chip Reliability

A passivation layer is a critical protective coating on semiconductor chips, shielding internal structures from moisture, contamination, and mechanical stress. Using multi-layer materials like SiO₂, Si₃N₄, and polyimide enhances reliability. For precise

3D Surface Analysis: Functions and Advantages of the Atometrics Spectral Confocal Displacement Sensor

3D Surface Analysis: Functions and Advantages of the Atometrics Spectral Confocal Displacement Sensor

The Spectral Confocal Displacement Sensor delivers high-precision 3D surface analysis with 2048 points per contour. It achieves sub-micron accuracy, compatible with diverse materials, and offers high-speed measurement up to 5000Hz, ideal for industrial i

Tunable Microlens Array Technology Roadmap: An Introduction for Specialists in High-Precision Measuring Instruments and White Light Interferometry

Tunable Microlens Array Technology Roadmap: An Introduction for Specialists in High-Precision Measuring Instruments and White Light Interferometry

Tunable Microlens Arrays enable dynamic focusing for high-resolution 3D imaging via shape, refractive index, or phase tuning. This technology overcomes traditional fixed-focus limits, offering flexible precision measurement crucial for advanced optical s

The Role of the White Light Interferometer and White Light Interference in Semiconductor Particle Defect Control

The Role of the White Light Interferometer and White Light Interference in Semiconductor Particle Defect Control

Particle defects critically impact semiconductor device yield and reliability. Their detection requires high-precision tools like the white light interferometer, which utilizes White Light Interference for nanoscale defect mapping alongside SEM. Effecti

Advanced 3D Surface Analysis and Surface Roughness Metrology with Spectral Confocal Sensors

Advanced 3D Surface Analysis and Surface Roughness Metrology with Spectral Confocal Sensors

The AS-7000 series sensor utilizes spectral confocal technology for high-precision, multi-material 3D measurement. Its core applications include 3D surface analysis and surface roughness metrology, alongside capturing topography, texture, and spectral da

BoardStone Intelligent: Specialist in High-Precision Measuring Instruments Shaping the Future of White Light Interferometer Applications

BoardStone Intelligent: Specialist in High-Precision Measuring Instruments Shaping the Future of White Light Interferometer Applications

BoardStone Intelligent is a Specialist in High-Precision Measuring Instruments, providing advanced solutions like the White Light Interferometer. It drives domestic substitution in semiconductor and optical manufacturing with rapid, customized services,

Ensuring Atomizing Disc Performance: Precision Blind Hole Measurement with White Light Interferometer & 3D Surface Roughness Analyzer

Ensuring Atomizing Disc Performance: Precision Blind Hole Measurement with White Light Interferometer & 3D Surface Roughness Analyzer

The performance of atomizing discs depends on the precision of their blind hole dimensions. Utilizing a White Light Interferometer for sub-nanometer measurement, combined with a 3D Surface Roughness Analyzer to characterize pore diameter and depth, is cr

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