The Roughness Profiler by Atometrics is designed for precise, non-contact measurement of surface roughness and texture. Combining optical interferometry and high-resolution imaging, it provides accurate quantitative evaluation of surface characteristics at the nanometer scale.
The Atometrics roughness profiler operates based on optical interferometry or confocal microscopy principles. A focused light beam scans across the sample surface, and the reflected signal is analyzed to reconstruct the microtopography. This method enables accurate evaluation of roughness parameters such as Ra, Rq, Rz, and Sa, providing a complete picture of the surface morphology without touching the sample.
Atometrics roughness profiler systems are widely used in industries that demand precise surface characterization:
As a specialist in high-precision measuring instruments, Atometrics integrates optics, automation, and intelligent algorithms to provide robust surface metrology solutions. Our roughness profilers deliver high speed, stability, and repeatability, helping manufacturers maintain top-quality surface finishes and ensure process consistency.
Atometrics Roughness Profiler solutions offer precise, non-contact, and high-resolution surface roughness measurement for a wide range of materials and industries. From R&D laboratories to automated production lines, our instruments provide the accuracy and reliability needed for advanced quality assurance and product optimization.