Large Depth of Field Microscope

The Large Depth of Field Microscope from Atometrics is designed for high-resolution, non-contact optical inspection with an extended depth of focus. It allows clear visualization of samples with uneven surfaces, multi-level structures, or complex geometries, making it ideal for precision inspection and research applications.

Working Principle

Atometrics large depth of field microscopes use advanced optical designs combined with digital imaging sensors. Intelligent software stitches multiple focus layers to generate a fully focused image across the entire sample depth. This non-contact technique ensures that even samples with large height variations can be inspected without distortion or damage.

Key Features

• Extended depth of field: Provides fully focused images for samples with large height variations.
• Non-contact inspection: Prevents damage to delicate or sensitive surfaces while delivering accurate measurements.
• High-resolution imaging: Captures fine details for precise analysis of microstructures and surfaces.
• Advanced software analysis: Supports measurements, annotations, multi-focus image reconstruction, and report generation.
• Versatile applications: Suitable for electronics, materials research, optical components, and industrial quality control.

Applications

Atometrics large depth of field microscopes are widely applied in:

• Electronics and PCB inspection
• Semiconductor and micro-component evaluation
• Material science and surface roughness analysis
• Optical lens and precision mechanical parts inspection
• Industrial R&D laboratories

Why Choose Atometrics

As a specialist in high-precision measuring instruments, Atometrics combines optical innovation, extended focus design, and intelligent software to provide robust, repeatable, and efficient inspection solutions. Our microscopes deliver accurate imaging and measurement, even for samples with challenging surface geometries.

Conclusion

Atometrics Large Depth of Field Microscope ensures high-resolution, non-contact inspection of complex surfaces with extended depth focus. From R&D laboratories to industrial production lines, it provides reliable visualization, precise measurement, and enhanced quality control.