The Film Thickness Measurement System from Atometrics is designed for precise, non-contact measurement of thin films, coatings, and surface layers. By combining advanced optical sensors, laser displacement technology, and intelligent software, the system delivers fast, accurate, and repeatable measurements, ensuring reliable quality control.
Atometrics film thickness measurement systems operate using optical interferometry, confocal, or reflectometry methods. These techniques allow precise detection of coating thickness, refractive index, and surface profile. The system provides accurate, non-contact measurements even for extremely thin or multi-layer coatings, ensuring minimal risk of sample damage.
Atometrics film thickness measurement systems are widely used in:
As a specialist in high-precision measuring instruments, Atometrics integrates optical measurement technology, laser systems, and intelligent software to deliver robust, accurate, and efficient measurement solutions. Our film thickness measurement systems ensure consistent quality control and reliable data for both laboratory and industrial environments.
Atometrics Film Thickness Measurement System provides precise, non-contact measurement of coatings and thin films. From R&D labs to production lines, it delivers reliable results for quality control, process optimization, and advanced surface analysis.