Interferometric Surface Profiler

The Interferometric Surface Profiler from Atometrics is a high-precision, non-contact optical measurement system designed to measure surface topography, step height, and roughness with nanometer-level accuracy. Using white light interferometry, it provides detailed 3D surface profiles for industrial, scientific, and research applications.

Measurement Principle

The system employs white light interferometry to analyze interference patterns generated by light reflected from both the sample surface and a reference mirror. These interference fringes are converted into height data, enabling the profiler to reconstruct a precise 3D model of the surface. This technique ensures accurate and repeatable measurements without physically contacting the sample.

Key Features

• Nanometer-level precision: Capable of measuring ultra-fine surface features and step heights.
• Non-contact measurement: Ideal for delicate or highly reflective surfaces.
• 3D surface reconstruction: Generates detailed 3D surface maps for texture and profile analysis.
• Wide measurement range: Suitable for smooth optics and rough engineering surfaces.
• Automated analysis software: Provides roughness parameters (Ra, Sa, Rq, Sq) and data export functions.

Applications

Atometrics Interferometric Surface Profilers are used in various industries and research fields, including:

• Optical component and lens inspection
• Semiconductor wafer surface analysis
• Thin film and coating thickness evaluation
• Precision mechanics and MEMS device testing
• Material science and nanotechnology research

Why Choose Atometrics

As a specialist in high-precision measuring instruments, Atometrics combines advanced interferometric technology with intelligent software for accurate, efficient, and stable measurement performance. Our profilers ensure traceable and repeatable results, supporting both laboratory research and industrial production environments.

Conclusion

Atometrics Interferometric Surface Profiler offers precise, non-contact 3D surface measurement for a wide range of applications. With nanometer-level accuracy and advanced data analysis capabilities, it is an essential tool for researchers and manufacturers requiring high-resolution surface characterization.