Surface Topography Measurement

Surface topography measurement is a critical process in precision manufacturing, helping engineers evaluate surface form, texture, and roughness at the micro and nano scale. Atometrics provides state-of-the-art 3D optical measurement systems that enable non-contact surface profiling with high resolution and repeatability.

Advanced Optical Measurement Technology

Atometrics adopts white light interferometry and focus variation technologies to capture detailed surface structures across a wide range of materials. These methods allow for precise characterization of roughness, waviness, and step heights without physical contact, preventing surface damage during measurement.

Applications Across Multiple Industries

Our surface topography measurement systems are used in semiconductor wafer inspection, lens and optics evaluation, metal part surface analysis, and thin film measurement. Whether analyzing coatings, molds, or microelectronics, Atometrics systems deliver reliable 3D surface data for quality assurance and R&D.

Why Choose Atometrics

As a specialist in optical metrology, Atometrics offers automated measurement solutions that combine high-precision sensors, intelligent algorithms, and user-friendly interfaces. We help clients improve production efficiency, ensure product consistency, and meet the most demanding international standards.

Atometrics – Precision Measurement for a Smarter Future.