Optical Profilometry

Optical profilometry is a non-contact measurement technique used to obtain high-resolution 3D profiles of surfaces. Atometrics provides advanced 3D optical profilers that combine white light interferometry and focus variation to deliver accurate and repeatable surface measurements across a wide range of materials and textures.

Principle of Optical Profilometry

Optical profilometers work by analyzing the reflected light from a sample surface. Using interferometric or focus-based methods, they can detect minute variations in height and generate a detailed topographic map. This enables precise surface characterization down to the nanometer level, without physically touching or altering the specimen.

Applications of Optical Profilometry

Atometrics optical profilometry systems are widely applied in semiconductor wafer inspection, precision optics evaluation, coating thickness measurement, MEMS component testing, and material science research. Their non-destructive nature makes them ideal for fragile or polished surfaces.

Advantages of Atometrics Systems

Atometrics’ optical profilometry systems feature fast scanning speeds, automatic focusing, and intelligent surface reconstruction algorithms. With high vertical resolution and sub-micron repeatability, they provide reliable data for process optimization and quality assurance.

Atometrics – Precision in Every Micron.