Surface texture analysis is essential for understanding the microstructural properties of materials and ensuring product quality in precision manufacturing. Atometrics offers advanced 3D optical surface measurement systems designed for non-contact analysis of surface form, roughness, and waviness with exceptional accuracy and reliability.
Atometrics employs optical profilometry and white light interferometry technologies to capture high-resolution 3D surface data. These non-contact techniques allow accurate surface characterization without damaging delicate or polished surfaces, making them ideal for both industrial and research applications.
Our surface texture analysis systems are used in semiconductor wafer evaluation, precision machining inspection, thin film measurement, and materials science research. The system’s ability to visualize surface topography in three dimensions enables users to assess surface quality, process consistency, and wear resistance with ease.
Atometrics combines high-resolution sensors, fast scanning speed, and intelligent data processing algorithms to deliver comprehensive surface texture analysis results. With our user-friendly interface and automated measurement features, engineers can efficiently obtain reliable data for design validation and production optimization.
Atometrics – Precision in Every Surface Detail.