Surface Metrology

Surface metrology focuses on the precise measurement and characterization of surface features, including form, waviness, and roughness. Atometrics offers cutting-edge 3D optical surface metrology systems that utilize non-contact technologies such as interferometry and focus variation to deliver high-resolution surface analysis.

Advanced Optical Measurement Technology

Atometrics’ surface metrology systems employ white light interferometry and optical profilometry to capture detailed topographical data with sub-micron accuracy. These optical techniques ensure reliable results without mechanical contact, preserving the integrity of delicate or polished surfaces during measurement.

Applications in Precision Industries

Our systems are widely used in semiconductor wafer inspection, optical component testing, precision machining evaluation, and material research. The ability to visualize and quantify 3D surface structures helps manufacturers and researchers maintain strict quality standards and optimize production processes.

Why Choose Atometrics

As a specialist in optical metrology, Atometrics provides flexible, automated, and user-friendly solutions for surface measurement. With high vertical resolution, repeatable accuracy, and intelligent data analysis, our instruments deliver comprehensive surface metrology results for every stage of product development.

Atometrics – Precision Defined by Light.