Roughness RMS PV

Roughness RMS (Root Mean Square) and PV (Peak-to-Valley) are key parameters in surface metrology used to quantify the micro-scale texture and deviations of surfaces. Atometrics offers advanced non-contact optical measurement systems to evaluate these parameters accurately and efficiently.

Understanding RMS and PV

The RMS value represents the standard deviation of surface heights, providing a statistical measure of surface roughness. PV indicates the vertical distance between the highest peak and the lowest valley on a surface. Together, these parameters give a comprehensive view of surface texture, essential for quality control and process optimization.

Measurement Technology

Atometrics systems utilize optical profilometry and white light interferometry to capture detailed 3D surface topography. The non-contact nature of these methods ensures precise measurement without damaging delicate or polished surfaces. Advanced software analyzes the captured data to calculate RMS, PV, and other roughness parameters automatically.

Applications

Roughness RMS and PV measurements are widely applied in:

• Semiconductor wafer inspection
• Optical component and lens evaluation
• Precision machined parts
• Thin film and coating analysis
• Material science and R&D laboratories

Why Choose Atometrics

As a specialist in high-precision measuring instruments, Atometrics provides systems that combine accurate sensors, intelligent analysis algorithms, and user-friendly interfaces to deliver reliable and repeatable surface roughness measurements, including RMS and PV values. Our solutions support both industrial production and scientific research.

Atometrics – Precision Surface Analysis with RMS and PV Accuracy.