Surface Roughness Analysis

Surface roughness analysis is essential for understanding the micro-scale texture and quality of material surfaces. Atometrics offers advanced non-contact optical measurement systems to accurately evaluate surface roughness, providing detailed 3D surface profiles and quantitative roughness parameters.

Measurement Principles

Atometrics systems utilize white light interferometry and optical profilometry to measure surface roughness without physical contact. These techniques capture precise 3D topography of surfaces, allowing calculation of parameters such as Ra, Rq, RMS, PV, and Sa for comprehensive texture characterization.

Applications

Our surface roughness analysis solutions are widely used in semiconductor wafer inspection, precision optics, automotive and aerospace component evaluation, thin film and coating measurement, and materials science research. These systems provide reliable and repeatable data for quality control and process optimization.

Advantages of Atometrics Systems

• Non-contact measurement ensures no surface damage
• High vertical resolution and micron-level accuracy
• Fast and automated scanning with intelligent data analysis
• Comprehensive roughness parameter evaluation (Ra, Rq, RMS, PV, Sa)
• User-friendly software interface for easy operation and reporting

Why Choose Atometrics

As a specialist in high-precision measuring instruments, Atometrics provides reliable and repeatable solutions for surface roughness analysis. Our instruments combine advanced optical sensors, intelligent algorithms, and flexible software to deliver high-quality 3D surface data for both industrial and research applications.

Atometrics – Accurate Surface Roughness Analysis for Precision Engineering.