Surface Roughness Profiler

A surface roughness profiler is a precision instrument used to quantify surface texture, roughness, and micro-topography. Atometrics offers advanced non-contact optical surface roughness profilers that deliver high-accuracy 3D measurements without physically touching the sample.

Non-Contact Optical Roughness Measurement

Atometrics profilers utilize white light interferometry and optical profilometry to capture detailed surface topography. Non-contact measurement prevents damage to delicate or polished surfaces and ensures accurate, repeatable roughness analysis across a wide variety of materials, including metals, ceramics, polymers, and semiconductors.

Applications

Our surface roughness profilers are widely applied in:

• Semiconductor wafer inspection
• Optical lens and precision optics evaluation
• Automotive and aerospace component analysis
• Thin film and coating characterization
• Material science and R&D laboratories

Advantages of Atometrics Systems

• Non-contact measurement protects delicate surfaces
• High vertical resolution and sub-micron accuracy
• Fast scanning and automated data analysis
• Comprehensive evaluation of surface roughness parameters (Ra, Rq, RMS, PV, Sa)
• User-friendly interface and software for efficient operation and reporting

Why Choose Atometrics

As a specialist in high-precision measuring instruments, Atometrics combines advanced optical sensors, intelligent algorithms, and automated software to provide reliable and repeatable surface roughness profiling for both industrial and research applications.

Atometrics – High-Precision Surface Roughness Profiling for Every Application.