Surface Roughness Metrology

Surface roughness metrology is crucial for assessing the micro-scale texture and quality of material surfaces. Atometrics offers advanced non-contact optical measurement systems designed for precise 3D surface characterization and quantitative roughness analysis.

Non-Contact Optical Measurement

Atometrics systems use white light interferometry and optical profilometry to capture high-resolution 3D surface data. Non-contact measurement ensures delicate or polished surfaces are not damaged while providing reliable and repeatable results for roughness parameters such as Ra, Rq, RMS, PV, and Sa.

Applications

Our surface roughness metrology solutions are widely used in:

• Semiconductor wafer inspection
• Precision optics and lens evaluation
• Automotive and aerospace component analysis
• Thin film and coating measurement
• Material science and R&D laboratories

Advantages of Atometrics Systems

• Non-contact measurement protects sensitive surfaces
• High vertical resolution and micron-level accuracy
• Automated scanning and intelligent data analysis
• Comprehensive roughness and surface texture evaluation
• User-friendly software interface for fast operation and reporting

Why Choose Atometrics

As a specialist in high-precision measuring instruments, Atometrics combines cutting-edge optical sensors, intelligent algorithms, and automated software to deliver reliable and repeatable surface roughness metrology solutions for both industrial and research applications.

Atometrics – Accurate Surface Roughness Metrology for Precision Engineering.