Surface Roughness Measurement System

A surface roughness measurement system is essential for evaluating the fine texture and topography of material surfaces. Atometrics develops high-precision non-contact optical measurement systems that deliver accurate and repeatable surface roughness data for industrial quality control and scientific research.

High-Precision Non-Contact Measurement

Atometrics systems utilize white light interferometry and optical profilometry to capture 3D surface profiles with sub-micron resolution. Non-contact measurement ensures surface integrity, making it ideal for fragile, polished, or reflective materials that cannot be measured using traditional contact methods.

Applications

Our surface roughness measurement systems are widely used in:

• Semiconductor wafer inspection
• Optical lens and precision optics evaluation
• Automotive and aerospace component analysis
• Thin film and coating characterization
• Material science and R&D laboratories

Advantages of Atometrics Systems

• Non-contact measurement avoids surface damage
• High vertical resolution and micron-level accuracy
• Automated scanning and intelligent data processing
• Comprehensive evaluation of roughness parameters (Ra, Rq, RMS, PV, Sa)
• User-friendly software interface for fast analysis and reporting

Why Choose Atometrics

As a specialist in high-precision measuring instruments, Atometrics integrates advanced optical sensors, smart algorithms, and automated analysis software to deliver reliable and repeatable surface roughness measurement systems for both industrial and research applications.

Atometrics – Precision Surface Roughness Measurement for Quality and Innovation.