Surface Roughness Analysis System

A surface roughness analysis system is a precision instrument designed to measure, quantify, and analyze surface texture and micro-topography. Atometrics develops non-contact optical systems that provide accurate 3D surface roughness data, suitable for industrial quality control and advanced research applications.

High-Precision Non-Contact Measurement

Atometrics surface roughness analysis systems employ white light interferometry, focus variation, and optical profilometry to capture detailed 3D surface profiles. Non-contact measurement ensures no surface damage while achieving sub-micron vertical resolution and repeatable, reliable results.

Applications

Our surface roughness analysis systems are widely applied in:

• Semiconductor wafers and MEMS surface characterization
• Optical lens, coating, and thin film analysis
• Precision machined parts and microfabrication inspection
• Automotive and aerospace component surface evaluation
• Material science research and academic laboratories

Advantages of Atometrics Surface Roughness Analysis System

• Non-contact 3D surface roughness measurement with sub-micron accuracy
• Fast scanning and automated data acquisition
• Comprehensive surface parameters (Ra, Rq, RMS, Rz, Sa, Sq)
• Supports a variety of materials and complex surfaces
• User-friendly software for visualization, analysis, and reporting

Why Choose Atometrics

Atometrics is a specialist in high-precision measuring instruments, integrating advanced optical metrology, imaging sensors, and intelligent software to deliver reliable surface roughness analysis systems. Our solutions help manufacturers and researchers achieve precise surface evaluation, quality control, and process optimization.

Atometrics – Precision Surface Roughness Analysis Systems for Industrial and Research Applications.