Surface Roughness Measurement Instrument

A surface roughness measurement instrument is a precision device designed to measure and analyze surface texture, roughness, and topography in three dimensions. Atometrics develops high-accuracy optical instruments that provide non-contact, repeatable, and fast surface measurement for industrial and research applications.

High-Precision Non-Contact Measurement

Using white light interferometry, focus variation, and optical profilometry, Atometrics surface roughness measurement instruments achieve nanometer-level vertical resolution. Non-contact measurement ensures no surface damage while delivering reliable and reproducible results for delicate or complex materials.

Applications

Our surface roughness measurement instruments are widely used in:

• Semiconductor wafer and MEMS device inspection
• Optical lens, coating, and thin film surface analysis
• Precision machined parts and microfabrication evaluation
• Automotive and aerospace component quality control
• Material science research and academic laboratories

Advantages of Atometrics Surface Roughness Measurement Instrument

• Non-contact 3D surface roughness measurement with sub-micron precision
• Fast scanning and automated data acquisition
• Comprehensive roughness parameters (Ra, Rq, Rz, RMS, Sa, Sq)
• Supports a wide range of materials and surface finishes
• Intuitive software interface for visualization, reporting, and data analysis

Why Choose Atometrics

Atometrics is a specialist in high-precision measuring instruments, combining advanced optical metrology, intelligent imaging, and automation to deliver reliable surface roughness measurement instruments. Our systems help manufacturers and researchers achieve precise surface evaluation, improved quality control, and optimized production processes.

Atometrics – High-Precision Surface Roughness Measurement Instruments for Advanced Surface Metrology.