Surface Roughness Measurement Procedure

The surface roughness measurement procedure is a systematic approach to evaluating the micro-topography, texture, and roughness of surfaces. Atometrics develops advanced non-contact optical systems that enable precise and repeatable 3D surface roughness measurements for industrial and research applications.

High-Precision Non-Contact Measurement

Atometrics surface roughness measurement procedures employ white light interferometry, focus variation, and optical profilometry to capture detailed surface data. Non-contact measurement ensures delicate or soft surfaces remain undamaged while providing nanometer-level resolution and consistent results.

Applications

Our surface roughness measurement procedures are widely used in:

• Semiconductor wafer and MEMS device inspection
• Optical lens, coating, and thin film roughness evaluation
• Precision machined parts and microfabrication analysis
• Automotive and aerospace component quality control
• Material science research and development laboratories

Advantages of Atometrics Surface Roughness Measurement Procedure

• Non-contact 3D surface roughness measurement with high precision
• Automated scanning and comprehensive roughness analysis
• Supports multiple roughness parameters including Ra, Rq, Rz, RMS, Sa, Sq
• Suitable for a wide range of materials and complex surface geometries
• User-friendly software for visualization, reporting, and data management

Why Choose Atometrics

Atometrics specializes in high-precision measuring instruments, integrating advanced optics, imaging sensors, and intelligent software. Our surface roughness measurement procedures ensure reliable, accurate, and repeatable results for industrial, research, and precision manufacturing applications.

Atometrics – Reliable Surface Roughness Measurement Procedures for Advanced Surface Metrology and Quality Control.