Optical Surface Roughness Procedure | Atometrics High-Precision 3D Surface Measurement
2025-10-08

Optical Surface Roughness Procedure

The optical surface roughness procedure is a high-precision method for evaluating surface texture, roughness, and micro-topography using non-contact optical techniques. Atometrics develops advanced systems that integrate white light interferometry, focus variation, and optical profilometry to provide accurate 3D surface roughness measurements.

High-Precision Non-Contact Measurement

Atometrics optical surface roughness procedures use non-contact 3D measurement methods, ensuring delicate surfaces remain undamaged while achieving nanometer-level vertical resolution. Automated scanning and advanced algorithms provide reproducible and reliable roughness data for both industrial and research applications.

Applications

Our optical surface roughness procedures are widely applied in:

  • Semiconductor wafers and MEMS device surface evaluation
  • Optical lens, thin film, and coating roughness analysis
  • Precision machined components and microfabrication inspection
  • Automotive and aerospace component quality control
  • Material science and R&D laboratories

Advantages of Atometrics Optical Surface Roughness Procedure

  • Non-contact optical 3D surface roughness measurement with high precision
  • Automated scanning and comprehensive roughness analysis
  • Supports multiple surface parameters including Ra, Rq, Rz, RMS, Sa, Sq
  • Suitable for various materials and complex geometries
  • User-friendly software for visualization, reporting, and data management

Why Choose Atometrics

Atometrics specializes in high-precision measuring instruments, integrating advanced optics, imaging sensors, and intelligent software. Our optical surface roughness procedures provide accurate, reliable, and repeatable measurements, supporting quality control, research, and industrial process optimization.

Atometrics – High-Precision Optical Surface Roughness Procedures for Advanced Surface Metrology and Quality Control.