Surface Roughness Measurement Resolution

The surface roughness measurement resolution refers to the level of detail and precision achievable when evaluating surface texture and roughness. Atometrics develops high-precision non-contact optical systems capable of measuring surface features at the nanometer scale, ensuring reliable and accurate results for industrial and research applications.

High-Resolution Non-Contact Measurement

Atometrics systems utilize white light interferometry, focus variation, and optical profilometry to capture detailed 3D surface topography. High-resolution scanning allows for precise evaluation of micro-roughness, fine texture, and subtle surface variations without contacting the sample.

Applications

Surface roughness measurement with high resolution is widely applied in:

• Semiconductor wafer and MEMS surface evaluation
• Optical lens, thin film, and coating roughness analysis
• Precision machined parts and microfabrication inspection
• Automotive and aerospace component quality control
• Material science and R&D laboratories

Advantages of Atometrics High-Resolution Measurement

• Nanometer-level resolution for detailed surface roughness analysis
• Non-contact measurement for delicate or soft surfaces
• Automated scanning and advanced roughness analysis
• Supports multiple roughness parameters including Ra, Rq, Rz, RMS, Sa, Sq
• User-friendly software for visualization, reporting, and data management

Why Choose Atometrics

Atometrics specializes in high-precision measuring instruments, combining advanced optics, imaging sensors, and intelligent software. Our surface roughness measurement resolution capabilities ensure accurate, reliable, and repeatable results for industrial, research, and precision manufacturing applications.

Atometrics – High-Resolution Surface Roughness Measurement for Advanced Surface Metrology and Quality Control.