Advanced Interferometric Surface Profiler

The advanced interferometric surface profiler is a high-precision, non-contact system for 3D surface measurement and surface roughness analysis. Atometrics develops state-of-the-art interferometric profilers that combine white light interferometry, optical profilometry, and intelligent software for accurate surface characterization.

High-Precision Non-Contact Surface Measurement

Atometrics systems provide nanometer-level resolution to capture detailed 3D surface topography. Non-contact measurement ensures delicate or soft surfaces remain undamaged while delivering repeatable and reliable results for industrial and research applications.

Applications

Advanced interferometric surface profilers are widely applied in:

• Semiconductor wafers and MEMS device inspection
• Optical lenses, thin films, and coating surface evaluation
• Precision machined components and microfabrication quality control
• Automotive and aerospace component surface analysis
• Material science and R&D laboratories

Advantages of Atometrics Advanced Interferometric Surface Profilers

• Non-contact 3D surface measurement for delicate surfaces
• High-resolution interferometric profiling with nanometer accuracy
• Automated scanning and advanced roughness analysis
• Supports multiple roughness and topography parameters including Ra, Rq, Rz, RMS, Sa, Sq
• User-friendly software for visualization, reporting, and data management

Why Choose Atometrics

Atometrics specializes in high-precision measuring instruments, integrating advanced interferometry, optical sensors, and intelligent software. Our advanced interferometric surface profiler provides accurate, reliable, and repeatable results for industrial, research, and precision manufacturing applications.

Atometrics – High-Precision Advanced Interferometric Surface Profilers for 3D Surface Metrology and Quality Control.