Film Thickness Metrology System

A film thickness metrology system measures the uniformity and thickness of thin films and coatings using high-precision, non-contact optical methods. Atometrics develops advanced metrology systems that combine white light interferometry, focus variation, and optical profilometry to provide accurate and reliable thickness measurements.

High-Precision Non-Contact Film Measurement

Atometrics film thickness metrology systems deliver micron- and nanometer-level resolution without contacting the sample. Automated scanning and advanced software ensure precise, repeatable measurements for industrial and research applications.

Applications

Film thickness metrology is widely applied in:

• Semiconductor wafer and MEMS device coating evaluation
• Optical lenses, thin films, and transparent coatings
• Protective and functional coatings on industrial components
• Automotive and aerospace coating quality control
• Material science research and R&D laboratories

Advantages of Atometrics Film Thickness Metrology Systems

• Non-contact measurement protects delicate films and surfaces
• High-resolution thickness evaluation with nanometer accuracy
• Automated scanning and advanced analysis of film uniformity
• Supports flat, curved, and complex surfaces
• User-friendly software for visualization, reporting, and data management

Why Choose Atometrics

Atometrics specializes in high-precision measuring instruments, integrating advanced optics, imaging sensors, and intelligent software. Our film thickness metrology systems provide accurate, reliable, and repeatable results for industrial, research, and precision manufacturing applications.

Atometrics – High-Precision Film Thickness Metrology Systems for Advanced Coating and Surface Analysis.