Film Thickness Measurement Instrument

The Film Thickness Measurement Instrument from ATOMetrics is designed to provide fast, non-contact, and high-precision measurement for various film materials, including transparent coatings, semiconductor films, and display layers. Utilizing advanced optical interferometry and laser displacement technology, it ensures repeatable and accurate results down to nanometer resolution.

Core Features

• Non-contact measurement: Avoids damage to soft or delicate films.
• High accuracy: Nanometer-level thickness resolution ensures process reliability.
• Fast response: Real-time measurement suitable for inline inspection systems.
• Material versatility: Compatible with transparent, reflective, and multilayer films.
• Stable performance: Excellent repeatability even under fluctuating environmental conditions.

Applications

This instrument is widely applied in industries that require precise thin film control and quality assurance:

• Semiconductor wafer coating and photoresist measurement
• Optical lens coating thickness verification
• Flat panel display and touch screen manufacturing
• Packaging and protective film production
• Automotive and aerospace surface coating analysis

Measurement Principle

ATOMetrics Film Thickness Measurement System operates based on optical interference or confocal laser technology. The sensor emits a light beam onto the film surface, and by analyzing the reflected signals from different interfaces, the system accurately calculates the film thickness. This non-contact method eliminates physical errors and provides consistent results across different materials and surfaces.

Advantages of ATOMetrics Solution

Compared with traditional contact-type measurement systems, ATOMetrics offers superior speed, accuracy, and versatility. It can be easily integrated into automated production lines or used as a standalone inspection tool. Its modular design supports multi-point measurement and customizable configurations to fit diverse industrial requirements.

Why Choose ATOMetrics

ATOMetrics has been focusing on optical metrology and precision measurement technology for years. Our Film Thickness Measurement Instruments are trusted by global semiconductor and display manufacturers for their stability and high performance. Whether in R&D laboratories or high-throughput production environments, ATOMetrics provides reliable solutions for film quality assurance.

For more information about our Film Thickness Measurement Instrument and customized measurement solutions, please contact ATOMetrics today.