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3D Spectrum Confocal Sensor AS Series
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Roughness/Step Height/Thickness
White Light Interferometer AM7000 Series
White Light interferometer AM8000 Series
Wafer 3D inspection solutions WM Series
Wafer 3D inspection solutions WPM Series
IC Substrate 3D Inspection Solutions EP Series
Wafer Thickness/TTV/Warpage Solution APS series
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Film Thickness Measurement Instrument
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AM8000 Series
Microscopic 3D Surface Topography Measurement System
Roughness/Step Height/3D Topography/Thickness
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AM7000 Series
White Light Interference
3D Surface Profilers
Accuracy up to sub-nanometer level On-line detection speed up to 1 second
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AR Series
3D Laser Profiler Sensor
Ultra-high precision / Ultra-fast speed / Ultra-small size
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AH3000 Series
Super Large Depth of Field
Digital Microscope
Easy operation, Comprehensive tools, High measurement accuracy
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FM Series
One-Touch Image Dimension Measurement System FM Series
Randomly place and one click measurement
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Product Center
Precision 3D measuring instruments and sensors, with accuracy ranging from nanometer to micron levels.
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Sensor
Image Measurement
Roughness/Step Height/Thickness
Digital Microscope
Instrument
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Industrial Application
Practice the concept of precise testing in all industrials and provide a complete set of measurement solutions
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New energy
Electronics Products
Semiconductor
Materials
Tools
Precise optics
Precise Machining
Display panel
Medical
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News
Discover more voices from Atometrics and get the latest developments from Atometrics in real time
News
Case Study
Knowledge articles
BoardStone Intelligent: Specialist in High-Precision Measuring Instruments Shaping the Future of White Light Interferometer Applications
2025-12-27
Ensuring Atomizing Disc Performance: Precision Blind Hole Measurement with White Light Interferometer & 3D Surface Roughness Analyzer
2025-12-26
The Importance of Photoresist Spin Coating and Its Thickness Monitoring Methods Using Film Thickness Metrology System and Film Thickness Measurement Instrument
2025-12-20
Atometrics White Light Interferometer with Surface Roughness Measurement Facilitates Research Advancement in 3D Printing Technology
2025-12-20
The Complete Semiconductor Process - Wafer Fabrication Process Incorporating Non-Contact Surface Measurement and Surface Roughness Metrology
2025-12-13
Quality Forged by Design! ATOMETRICS – Specialist in high-precision measuring instruments – White Light Interferometer AM-8000 Wins 2025 German Red Dot Award
2025-12-13
Surface Roughness Measurement with Atometrics White Light Interferometer & Flash Measurement System: Precision Inspection Case Study for Rubber Sealing Rings
2025-12-06
Industry Application - Film Thickness Measurement System with Atometrics Film Thickness Measurement Instrument: Supporting Hydrogen Energy Development for a Green, Low-Carbon Future
2025-12-06
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